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Autor: arun joshi
Philomin Juliana Ravi Singh Jesse Poland Sandesh Kumar Shrestha JULIO HUERTA_ESPINO Govindan Velu Suchismita Mondal Leonardo Abdiel Crespo Herrera UTTAM KUMAR arun joshi Thomas Payne Pradeep Kumar Bhati Vipin Tomar (2021)
A large-scale genome-wide association study was carried out to dissect the genetic architecture of wheat grain yield potential and stress-resilience. Based on the findings, grain yield-associated marker profiles were generated for a large panel of 73,142 wheat lines and the grain-yield favorable allele frequencies were also determined. The marker profile data are presented in this dataset.
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